Title :
Towards a test standard for board and system level mixed-signal interconnects
Author :
Thatcher, Carl W. ; Tulloss, Rodham E.
Author_Institution :
Ford Electron. Div., Lansdale, PA, USA
Abstract :
This paper describes basic requirements for a standard bus for testing analog interconnects. The viewpoint is that of prospective users. An architecture for such a standard bus is proposed. The basic conception is of a mixed-signal version of boundary-scan and is compatible with, indeed built upon, ANSI/IEEE Std 1149.1. The goals in mind are the detection of faults and the measurement of analog interconnect parameters. Among the desired benefits are test and test data commonality throughout an assembly hierarchy, from manufacturing to field service
Keywords :
IEEE standards; boundary scan testing; design for testability; fault location; mixed analogue-digital integrated circuits; printed circuit testing; printed circuits; ANSI/IEEE Std 1149.1.; analog interconnect parameters; analog interconnects; boundary-scan; detection of faults; field service; mixed-signal version; standard bus; system level mixed-signal interconnects; test standard; Automatic testing; Circuit testing; Costs; Design for testability; Electronic equipment testing; Integrated circuit testing; LAN interconnection; Probes; Software testing; System testing;
Conference_Titel :
Test Conference, 1993. Proceedings., International
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-1430-1
DOI :
10.1109/TEST.1993.470683
