• DocumentCode
    1827625
  • Title

    Advances in spray coating technologies for MEMS, 3DICs and additional applications

  • Author

    Pabo, E.F. ; Kurotaki, H. ; Lindner, Philipp ; Matthias, T. ; Kettner, P.

  • Author_Institution
    EV Group Inc., Tempe, AZ, USA
  • fYear
    2011
  • fDate
    7-9 Dec. 2011
  • Firstpage
    349
  • Lastpage
    353
  • Abstract
    Photolithography is a core technology for the manufacturing of complimentary metal oxide semiconductor (CMOS) integrated circuits (IC) and one process step in photolithography is the application of the photoresist. This is normally done using spin coating. Micro electro mechanical system (MEMS) manufacturing leverages the process technologies developed for CMOS manufacturing and therefore spin coating is normally used for the application of photoresist and other materials in the MEMS manufacturing processes. Spin coating is based on depositing the photoresist on the substrate and then rotating or spinning the substrate to leave a thin and uniform layer behind. Spin coating is a very useful and well understood technology but it has fundamental limitations with respect to wafer topography, non-round substrates, fragile substrates, oversized substrates and material consumption.
  • Keywords
    CMOS integrated circuits; integrated circuit manufacture; micromechanical devices; photoresists; spin coating; spray coating techniques; three-dimensional integrated circuits; 3DIC; CMOS manufacturing; MEMS manufacturing processes; complimentary metal oxide semiconductor integrated circuits; fragile substrates; material consumption; microelectromechanical system manufacturing; non-round substrates; oversized substrates; photolithography; photoresist; spin coating; spray coating technologies; wafer topography; Coatings; Resists; Substrates; Surface topography; Surface treatment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging Technology Conference (EPTC), 2011 IEEE 13th
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4577-1983-7
  • Electronic_ISBN
    978-1-4577-1981-3
  • Type

    conf

  • DOI
    10.1109/EPTC.2011.6184444
  • Filename
    6184444