DocumentCode :
1827702
Title :
Build-up electrical insulation material with low-dielectric loss tangent, low-CTE and low-surface roughness
Author :
Horiki, Eita ; Suzuki, Isao ; Tanaka, Toshiaki ; Uenishi, Akihiro ; Shiomi, Kazuyoshi
Author_Institution :
IM Project, Sekisui Chem. Co., Ltd., Tsukuba, Japan
fYear :
2011
fDate :
7-9 Dec. 2011
Firstpage :
363
Lastpage :
368
Abstract :
With the increasing speed of information and communication equipment in recent years, together with the high-speed signal processing of LSIs, there is a requirement for build-up electrical insulation materials (used in IC package substrates) to have low-dielectric loss tangent which reduces dielectric loss so as to achieve low transmission loss in the high-frequency GHz bands. At the same time, there is an increasing need for materials to have low-CTEs (Coefficient of Thermal Expansion) so as to ensure highly reliable substrates. With our formulation technology, we have developed a next-generation film-shaped build-up electrical insulation material compatible with high-frequency signal transmission by using a composition of practical thermosetting epoxy resin, which has realized both a low-dielectric loss tangent and at the same time, a low-CTE. In addition, this material can show a low-surface roughness after the film desmear process. It is thus expected to help reduce not only dielectric loss by means of a low- dielectric loss tangent, but also conductor loss caused by the skin effect, and will promote fine line formation by means of SAP (Semi Additive Process).
Keywords :
dielectric losses; insulation; integrated circuit packaging; resins; thermal expansion; IC package substrate; LSI; SAP; electrical insulation material; film desmear process; high-frequency signal transmission; high-speed signal processing; low-CTE; low-dielectric loss tangent; low-surface roughness; semiadditive process; skin effect; thermal expansion coefficient; thermosetting epoxy resin; transmission loss; Copper; Dielectric losses; Insulation; Materials; Propagation losses; Temperature measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Packaging Technology Conference (EPTC), 2011 IEEE 13th
Conference_Location :
Singapore
Print_ISBN :
978-1-4577-1983-7
Electronic_ISBN :
978-1-4577-1981-3
Type :
conf
DOI :
10.1109/EPTC.2011.6184447
Filename :
6184447
Link To Document :
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