DocumentCode :
1827737
Title :
Copper high volume manufacturing R&D to production
Author :
Chylak, Bob ; Clauberg, Horst ; Foley, John ; Qin, Ivy ; Milton, Basil
Author_Institution :
Packaging & Process Integration, Kulicke & Soffa Ind. Inc., Fort Washington, PA, USA
fYear :
2011
fDate :
7-9 Dec. 2011
Firstpage :
374
Lastpage :
381
Abstract :
In the last few years copper wire bonding has undergone a tremendous growth period. The driver behind this growth is the huge cost advantages over gold wire bonding. To achieve this, wire bonding assembly factories have invested heavily in R&D. Much of the development activity has targeted high pin count (300 -1200 I/O), finer pitch and high performance applications. Cu wire bonding has now been extended to finer pitch, lower-K and more sensitive pad structure applications, which have been considered impossible with Cu bonding in the past.
Keywords :
copper; fine-pitch technology; gold; lead bonding; Au; Cu; finer pitch applications; high performance applications; high volume manufacturing R&D; wire bonding assembly; Atmospheric modeling; Bonding; Copper; Gold; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Packaging Technology Conference (EPTC), 2011 IEEE 13th
Conference_Location :
Singapore
Print_ISBN :
978-1-4577-1983-7
Electronic_ISBN :
978-1-4577-1981-3
Type :
conf
DOI :
10.1109/EPTC.2011.6184449
Filename :
6184449
Link To Document :
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