Title : 
Copper high volume manufacturing R&D to production
         
        
            Author : 
Chylak, Bob ; Clauberg, Horst ; Foley, John ; Qin, Ivy ; Milton, Basil
         
        
            Author_Institution : 
Packaging & Process Integration, Kulicke & Soffa Ind. Inc., Fort Washington, PA, USA
         
        
        
        
        
        
            Abstract : 
In the last few years copper wire bonding has undergone a tremendous growth period. The driver behind this growth is the huge cost advantages over gold wire bonding. To achieve this, wire bonding assembly factories have invested heavily in R&D. Much of the development activity has targeted high pin count (300 -1200 I/O), finer pitch and high performance applications. Cu wire bonding has now been extended to finer pitch, lower-K and more sensitive pad structure applications, which have been considered impossible with Cu bonding in the past.
         
        
            Keywords : 
copper; fine-pitch technology; gold; lead bonding; Au; Cu; finer pitch applications; high performance applications; high volume manufacturing R&D; wire bonding assembly; Atmospheric modeling; Bonding; Copper; Gold; Wires;
         
        
        
        
            Conference_Titel : 
Electronics Packaging Technology Conference (EPTC), 2011 IEEE 13th
         
        
            Conference_Location : 
Singapore
         
        
            Print_ISBN : 
978-1-4577-1983-7
         
        
            Electronic_ISBN : 
978-1-4577-1981-3
         
        
        
            DOI : 
10.1109/EPTC.2011.6184449