• DocumentCode
    1827737
  • Title

    Copper high volume manufacturing R&D to production

  • Author

    Chylak, Bob ; Clauberg, Horst ; Foley, John ; Qin, Ivy ; Milton, Basil

  • Author_Institution
    Packaging & Process Integration, Kulicke & Soffa Ind. Inc., Fort Washington, PA, USA
  • fYear
    2011
  • fDate
    7-9 Dec. 2011
  • Firstpage
    374
  • Lastpage
    381
  • Abstract
    In the last few years copper wire bonding has undergone a tremendous growth period. The driver behind this growth is the huge cost advantages over gold wire bonding. To achieve this, wire bonding assembly factories have invested heavily in R&D. Much of the development activity has targeted high pin count (300 -1200 I/O), finer pitch and high performance applications. Cu wire bonding has now been extended to finer pitch, lower-K and more sensitive pad structure applications, which have been considered impossible with Cu bonding in the past.
  • Keywords
    copper; fine-pitch technology; gold; lead bonding; Au; Cu; finer pitch applications; high performance applications; high volume manufacturing R&D; wire bonding assembly; Atmospheric modeling; Bonding; Copper; Gold; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging Technology Conference (EPTC), 2011 IEEE 13th
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4577-1983-7
  • Electronic_ISBN
    978-1-4577-1981-3
  • Type

    conf

  • DOI
    10.1109/EPTC.2011.6184449
  • Filename
    6184449