DocumentCode :
1827841
Title :
Temperature soak reliability of laser-sintered Ag pads for wire bonding
Author :
Yamasaki, Kazuhiko ; Maekawa, Katsuhiro ; Niizeki, Tomotake ; Mita, Mamoru ; Matsuba, Yorishige ; Terada, Nobuto ; Saito, Hiroshi
Author_Institution :
Ibaraki Univ., Hitachi, Japan
fYear :
2011
fDate :
7-9 Dec. 2011
Firstpage :
397
Lastpage :
400
Abstract :
A small amount of Ag nanoparticles (5 nm in average diameter) was supplied to the tips of Cu lead-pins by ink-jet printing, and then metallized by laser irradiation to form circular wire-bonding pads between 2 and 3 μm thick and φ150 μm. A continuous-wave Nd:YAG laser (1064 nm in wavelength and 150 W in maximum power output) was employed in an argon atmosphere. A φ25 μm gold wire was bonded between the adjacent pads using an ultrasonic wire-bonder. The wire-bonded parts were placed in an atmospheric electric furnace for temperature soak tests in dry conditions at 150°C for up to 1000 h. Metallographic changes in the junctions were investigated by SEM, FIB, and EDX, while mechanical strength was examined by pull tests. No metallographic changes were observed in the 500 h specimen, whereas a slight solid-phase diffusion took place at both Cu/Ag and Ag/Au interfaces in the 1000 h specimen. The Ag pad formed on the Cu lead, above 2 μm in thickness, also prevented the degradation of pull strength; an average of 8.8 cN was maintained at both soak times. No separation from the first (ball) and second (wedge) bonds occurred, but the wire fractured close to the hook of the tester.
Keywords :
X-ray chemical analysis; electric furnaces; focused ion beam technology; ink jet printing; laser sintering; lead bonding; metallisation; nanoparticles; reliability; scanning electron microscopy; silver; Ag; EDX; FIB; SEM; argon atmosphere; circular wire-bonding pads; continuous-wave laser; electric furnace; ink-jet printing; laser irradiation; laser-sintered pads; lead-pins; mechanical strength; nanoparticles; size 2 mum; size 3 mum; temperature 150 degC; temperature soak reliability; temperature soak tests; time 1000 h; time 500 h; ultrasonic wire-bonder; Copper; Gold; Laser modes; Laser sintering; Lead; Nanoparticles; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Packaging Technology Conference (EPTC), 2011 IEEE 13th
Conference_Location :
Singapore
Print_ISBN :
978-1-4577-1983-7
Electronic_ISBN :
978-1-4577-1981-3
Type :
conf
DOI :
10.1109/EPTC.2011.6184453
Filename :
6184453
Link To Document :
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