Title :
White spots on a characterization map for the phase-change memory (PCM) and threshold switches
Author :
Kostylev, Sergey
Author_Institution :
Onyx International Consulting, LLC, USA
Abstract :
All major parameters of electronic PCM characterization happen to have some significant ¿nonuniversalities.¿ The presence of electrical contacts and interfaces allows only limited application of programming mechanisms typical for optical memory to electronic PCM. The fine structure of current voltage (IV) in a prethreshold (prethreshold conduction mechanisms can be affected by device size), and post-threshold range of currents and resistance current (RI) characteristics, will be discussed together with the dimensionality effects and the specifics of set and reset resistance programming in devices with different contact geometry. Some of discussed phenomena, and general functional possibilities of the effects of negative differential conductivity and switching in noncrystallizing and memory alloys, are presented.
Keywords :
electrical contacts; optical storage; phase change memories; characterization map; electrical contacts; electronic PCM characterization; memory alloys; negative differential conductivity; optical memory; phase-change memory switch; prethreshold conduction mechanisms; resistance current characteristics; resistance programming; threshold switch; white spots; Phase change materials; Phase change memory; chalcogenide; contacts; drift; interface; memory; phase-change;
Conference_Titel :
Non-Volatile Memory Technology Symposium (NVMTS), 2009 10th Annual
Conference_Location :
Portland, OR
Print_ISBN :
978-1-4244-4953-8
Electronic_ISBN :
978-1-4244-4954-5
DOI :
10.1109/NVMT.2009.5429781