DocumentCode
1828154
Title
Application of statistical techniques to critical system parameters
Author
Boyle, Rick ; Donovan, Jack ; Hnatek, Eugene ; Ijaz, Alex
Author_Institution
Tandem Comput. Inc., Cupertino, CA, USA
fYear
1993
fDate
17-21 Oct 1993
Firstpage
108
Lastpage
114
Abstract
An IC supplier´s specification or data sheet electrical parameter limits are meaningless without knowledge of the supplier´s process capability (i.e., a given critical electrical parameter´s centering and distribution), especially if one is attempting to select the most robust supplier. This paper provides practical examples of how statistical techniques can be used to facilitate selection of suppliers who are most capable of delivering product with minimal variation and for monitoring the ongoing performance of a supplier
Keywords
integrated circuit testing; production testing; quality control; statistical analysis; ASIC; PAL; SRAM; centering; critical system parameters; data sheet electrical parameter limits; distribution; specification; statistical techniques; supplier capability; Application software; Application specific integrated circuits; Distributed computing; Gaussian distribution; Integrated circuit testing; Lifting equipment; Monitoring; Packaging; Robustness; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1993. Proceedings., International
Conference_Location
Baltimore, MD
Print_ISBN
0-7803-1430-1
Type
conf
DOI
10.1109/TEST.1993.470712
Filename
470712
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