Title :
Test generation with high coverages for quiescent current test of bridging faults in combinational circuits
Author :
Isern, E. ; Figueras, J.
Author_Institution :
Dept. d´´Enginyeria Electron., Univ. Politecnica de Catalunya, Barcelona, Spain
Abstract :
Two test strategies for external and internal shorts in FCMOS combinational circuits, based on current consumption monitoring, are proposed and analysed: (a) pseudorandom test with a small number of vectors, and (b) a new strategy called current testing vector generation based on stuck at Faults (CUTEGENS). Both test strategies have been experimented on a set of combinational benchmark circuits. The pseudorandom test strategy has been found efficient when testing external shorts but coverages for internal shorts are not as satisfactory. CUTEGENS provides test sets with a reduced number of vectors, which have a very high coverage for both external and internal shorts. In most of the experimented circuits, the coverage has been shown to be the highest obtainable with current consumption monitoring
Keywords :
CMOS integrated circuits; combinational circuits; electric current measurement; fault diagnosis; integrated circuit testing; logic testing; short-circuit currents; ATPG; FCMOS combinational circuits; IDDQ testing; benchmark circuits; bridging faults; combinational circuits; current consumption monitoring; current testing vector generation; internal shorts; pseudorandom test; quiescent current test; stuck at Faults; Benchmark testing; Circuit faults; Circuit testing; Combinational circuits; Feedback circuits; Integrated circuit testing; Logic circuits; Logic testing; Monitoring; Semiconductor device modeling;
Conference_Titel :
Test Conference, 1993. Proceedings., International
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-1430-1
DOI :
10.1109/TEST.1993.470716
