Title :
A universal framework for managed built-in test
Author_Institution :
BT Lab., Ipswich, UK
Abstract :
An approach to systems test is presented that builds on earlier work by several design-for-test and test management standards committees and research teams. The approach is based on a generic model of a managed built-in test process supported by standard test descriptions
Keywords :
IEEE standards; automatic test equipment; built-in self test; design for testability; management; measurement standards; built-in test; design-for-test; test management standards committees; Assembly systems; Built-in self-test; Circuit faults; Circuit testing; Costs; Life testing; Performance evaluation; Printed circuits; Standards development; System testing;
Conference_Titel :
Test Conference, 1993. Proceedings., International
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-1430-1
DOI :
10.1109/TEST.1993.470722
