Title :
Testing digital circuits using a Mixed-Signal Automatic Test Equipment
Author_Institution :
Farmingdale State Coll., State Univ. of New York, Farmingdale, NY, USA
Abstract :
This paper presents the results of parametric testing of digital ICs using a dedicated Mixed Signal Automatic Testing Equipment. Due to the prohibitive price of the ATE equipment and dedicated Device Interface Board (DIB) for digital Integrated Circuits (ICs), a DIB for analog circuits was used to perform the testing. Despite the challenges presented by the experiments, the results prove to be accurate for the performed tests, according to the data sheet of the digital ICs and production test data provided by the manufacturer.
Keywords :
automatic test equipment; digital integrated circuits; integrated circuit testing; mixed analogue-digital integrated circuits; ATE equipment; DIB; analog circuit; device interface board; digital IC testing; digital integrated circuit testing; mixed-signal automatic test equipment; parametric testing; Automatic test equipment; Current measurement; Integrated circuits; Performance evaluation; Pins; Voltage measurement; IC data sheet; automatic test equipment; device-interface-board; digital circuits; parametric testing;
Conference_Titel :
Automation, Quality and Testing, Robotics, 2014 IEEE International Conference on
Conference_Location :
Cluj-Napoca
Print_ISBN :
978-1-4799-3731-8
DOI :
10.1109/AQTR.2014.6857855
