DocumentCode :
1828716
Title :
Evaluation of production yield for process selection
Author :
Lin, Chen-ju ; Kuo, Hsin-hui
Author_Institution :
Dept. of Ind. Eng. & Manage., Yuan Ze Univ., Chungli, Taiwan
fYear :
2010
fDate :
7-10 Dec. 2010
Firstpage :
458
Lastpage :
462
Abstract :
Process evaluation is a common yet important problem in industry. Among the key measurements such as quality, processing time, cost, and robustness, production yield is one of the fundamental criteria frequently adopted to evaluate the quality level of a process. A process with high yield is better capable of producing products meeting the requirements preset by customers. However, general evaluation procedures that count the number of defectives become inefficient especially when yield rates are high. This paper considers the processes evaluation problem by comparing the yield index Spk of two production lines with high quality. An effective and efficient approach is proposed to solve the problem. The analytical method examines the difference of two yields. The approach requires small sample sizes but sensitively distinguishes production yields. The results provide useful information to practitioners.
Keywords :
manufacturing processes; production management; quality management; evaluation procedures; process evaluation; process selection; production lines; production yield evaluation; quality level; yield index; yield rates; Indexes; Light emitting diodes; Manufacturing processes; Semiconductor device measurement; Testing; Quality management; process evaluation; yield;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Engineering and Engineering Management (IEEM), 2010 IEEE International Conference on
Conference_Location :
Macao
ISSN :
2157-3611
Print_ISBN :
978-1-4244-8501-7
Electronic_ISBN :
2157-3611
Type :
conf
DOI :
10.1109/IEEM.2010.5674490
Filename :
5674490
Link To Document :
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