Title :
Electromagnetic coupling effects in RFCMOS circuits
Author :
Adan, A.O. ; Fukumi, M. ; Higashi, K. ; Suyama, T. ; Miyamoto, M. ; Hayashi, M.
Author_Institution :
IC Dev. Group, Sharp Corp., Nara, Japan
Abstract :
The electromagnetic isolation and coupling characteristics of basic structures, namely metal pads, spiral inductors, and spiral-transistors, implemented in a core-logic CMOS process are evaluated and modeled. The models provide design guidelines on the isolation characteristics of guard-rings and shield layers for RF cross-talk suppression between circuit blocks. The importance of electromagnetic coupling to layout interconnects is demonstrated.
Keywords :
CMOS integrated circuits; UHF integrated circuits; capacitance; electromagnetic compatibility; electromagnetic coupling; equivalent circuits; inductors; integrated circuit layout; isolation technology; CMOS RFICs; EM coupling effects; EMC effects; RF crosstalk suppression; RFCMOS circuits; core-logic CMOS process; design guidelines; electromagnetic coupling characteristics; electromagnetic isolation characteristics; guard-rings; layout interconnects; metal pads; shield layers; spiral inductors; spiral-transistors; CMOS process; Coupling circuits; Electromagnetic coupling; Electromagnetic induction; Electromagnetic modeling; Electromagnetic shielding; Guidelines; Inductors; Semiconductor device modeling; Spirals;
Conference_Titel :
Microwave Symposium Digest, 2002 IEEE MTT-S International
Conference_Location :
Seattle, WA, USA
Print_ISBN :
0-7803-7239-5
DOI :
10.1109/MWSYM.2002.1011553
