• DocumentCode
    1828826
  • Title

    Investigation on Mechanism of Creep Corrosion of Immersion Silver Finished Printed Circuit Board by Clay Tests

  • Author

    Zhou, Yilin ; Pecht, Michael

  • fYear
    2009
  • fDate
    14-16 Sept. 2009
  • Firstpage
    324
  • Lastpage
    333
  • Keywords
    Circuit testing; Corrosion; Creep; Distributed computing; Polynomials; Printed circuits; Production systems; Robotics and automation; Silver; Throughput;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Contacts, 2009 Proceedings of the 55th IEEE Holm Conference on
  • Conference_Location
    Vancouver, British Columbia, Canada
  • Print_ISBN
    978-1-4244-3613-2
  • Electronic_ISBN
    978-1-4244-3613-2
  • Type

    conf

  • DOI
    10.1109/HOLM.2009.5284380
  • Filename
    5284380