DocumentCode :
1828980
Title :
An Original Apparatus for Endurance Testing of MEMS Electrical Contact Materials
Author :
Vincent, Maxime ; Chiesi, Laurent ; Rousset, Patrick ; Lapiere, Christophe ; Poulain, Christophe ; Carbone, Laurent ; Houzé, Frédéric ; Delamare, Jérôme
fYear :
2009
fDate :
14-16 Sept. 2009
Firstpage :
288
Lastpage :
292
Keywords :
Contact resistance; Degradation; Gold; Life testing; Magnetic materials; Materials testing; Micromechanical devices; Microswitches; Organic materials; Scanning probe microscopy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Contacts, 2009 Proceedings of the 55th IEEE Holm Conference on
Conference_Location :
Vancouver, British Columbia, Canada
Print_ISBN :
978-1-4244-3613-2
Electronic_ISBN :
978-1-4244-3613-2
Type :
conf
DOI :
10.1109/HOLM.2009.5284386
Filename :
5284386
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1828980
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