DocumentCode :
1829057
Title :
Experimental Validation of a 2-D Constriction Resistance Model at the Microscale
Author :
Bilhaut, Lise ; Poulain, Christophe ; Anciant, Romain ; Duraffourg, Laurent
fYear :
2009
fDate :
14-16 Sept. 2009
Firstpage :
293
Lastpage :
297
Keywords :
Apertures; Conductivity; Contact resistance; Electric resistance; Electrical resistance measurement; Electrons; Immune system; Micromechanical devices; Power system reliability; Predictive models;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Contacts, 2009 Proceedings of the 55th IEEE Holm Conference on
Conference_Location :
Vancouver, British Columbia, Canada
Print_ISBN :
978-1-4244-3613-2
Electronic_ISBN :
978-1-4244-3613-2
Type :
conf
DOI :
10.1109/HOLM.2009.5284387
Filename :
5284387
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1829057
بازگشت