DocumentCode :
1829164
Title :
Expected I-cache miss rates via the gap model
Author :
Quong, Russell W.
Author_Institution :
Sch. of Electr. Eng., Purdue Univ., West Lafayette, IN, USA
fYear :
1994
fDate :
18-21 Apr 1994
Firstpage :
372
Lastpage :
383
Abstract :
To evaluate the performance of a memory system, computer architects must determine the miss rate m of a cache C when running program P. Typically, the measured miss rate depends on the specific address mapping M of P set arbitrarily by the compiler and linker. The author removes the effect of the address-mapping on the miss rate by analyzing a symbolic trace T of basic blocks. By assuming each basic block has an equal probability of ending up anywhere in the address map, he determines the expected miss rate averaged over all possible address mappings. The resulting gap model gives the expected miss rate for instruction caches of varying cache size, line size, and set associativity. The model is simple but robust, and turns out to be the familiar LRU stack model with a statistical viewpoint. The model allows a trace of arbitrary length to he compactly summarized in a few thousand bytes of information. It also predicts how an intervening trace, such as an operating system call or a task switch, will affect the miss rate. Comparisons to measured miss rates from SPEC 92 instruction traces show that the model typically has relative differences of less than 20% for a variety of cache parameters
Keywords :
buffer storage; memory architecture; performance evaluation; LRU stack model; SPEC 92 instruction traces; basic block; cache; cache miss rates; cache parameters; gap model; instruction caches; line size; memory system; miss rate; performance; set associativity; symbolic trace; Benchmark testing; Computational modeling; Electric variables measurement; Operating systems; Predictive models; Program processors; Robustness; Sun; Switches; Time measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Architecture, 1994., Proceedings the 21st Annual International Symposium on
Conference_Location :
Chicago, IL
Print_ISBN :
0-8186-5510-0
Type :
conf
DOI :
10.1109/ISCA.1994.288134
Filename :
288134
Link To Document :
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