• DocumentCode
    1829189
  • Title

    Simultaneous microchannel formation and copper deposition on silicon along with surface treatment

  • Author

    Kulkarni, A.V. ; Jain, V.K. ; Misra, K.A.

  • Author_Institution
    Centre for Mechatron., Indian Inst. of Technol., Kanpur, India
  • fYear
    2010
  • fDate
    7-10 Dec. 2010
  • Firstpage
    571
  • Lastpage
    574
  • Abstract
    A process for simultaneous surface treatment, micromachining and copper deposition on silicon wafer is reported here. The process addresses three issues viz. surface treatment, micromachining to form microchannels and subsequent copper deposition into this microchannel on silicon surface simultaneously. The suggested process is based on the electrochemical spark phenomenon. At a time, in its conventional form it is used either for machining or for the deposition purposes. With the use of an alternating voltage (AC) supply, all the three phenomena are achieved simultaneously. Microchannels with copper deposition in them are characterized using scanning electron microscope (SEM), and elemental diffraction analysis using x rays (EDAX).
  • Keywords
    X-ray chemical analysis; copper; electrochemical analysis; electrodeposition; elemental semiconductors; micromachining; micromechanical devices; scanning electron microscopy; silicon; spark machining; surface treatment; Cu; EDAX; SEM; Si; X-ray elemental diffraction analysis; alternating voltage supply; copper deposition; electrochemical spark phenomenon; micromachining; scanning electron microscopy; silicon wafer surface; simultaneous microchannel formation; surface treatment; Anodes; Cathodes; Copper; Machining; Microchannel; Silicon; Surface treatment; Copper deposition; SEM; copper deposition; electrochemical process; electrochemical reaction EDAX; microchannels; micromachining; silicon; surface treatment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Engineering and Engineering Management (IEEM), 2010 IEEE International Conference on
  • Conference_Location
    Macao
  • ISSN
    2157-3611
  • Print_ISBN
    978-1-4244-8501-7
  • Electronic_ISBN
    2157-3611
  • Type

    conf

  • DOI
    10.1109/IEEM.2010.5674509
  • Filename
    5674509