DocumentCode :
1829189
Title :
Simultaneous microchannel formation and copper deposition on silicon along with surface treatment
Author :
Kulkarni, A.V. ; Jain, V.K. ; Misra, K.A.
Author_Institution :
Centre for Mechatron., Indian Inst. of Technol., Kanpur, India
fYear :
2010
fDate :
7-10 Dec. 2010
Firstpage :
571
Lastpage :
574
Abstract :
A process for simultaneous surface treatment, micromachining and copper deposition on silicon wafer is reported here. The process addresses three issues viz. surface treatment, micromachining to form microchannels and subsequent copper deposition into this microchannel on silicon surface simultaneously. The suggested process is based on the electrochemical spark phenomenon. At a time, in its conventional form it is used either for machining or for the deposition purposes. With the use of an alternating voltage (AC) supply, all the three phenomena are achieved simultaneously. Microchannels with copper deposition in them are characterized using scanning electron microscope (SEM), and elemental diffraction analysis using x rays (EDAX).
Keywords :
X-ray chemical analysis; copper; electrochemical analysis; electrodeposition; elemental semiconductors; micromachining; micromechanical devices; scanning electron microscopy; silicon; spark machining; surface treatment; Cu; EDAX; SEM; Si; X-ray elemental diffraction analysis; alternating voltage supply; copper deposition; electrochemical spark phenomenon; micromachining; scanning electron microscopy; silicon wafer surface; simultaneous microchannel formation; surface treatment; Anodes; Cathodes; Copper; Machining; Microchannel; Silicon; Surface treatment; Copper deposition; SEM; copper deposition; electrochemical process; electrochemical reaction EDAX; microchannels; micromachining; silicon; surface treatment;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Engineering and Engineering Management (IEEM), 2010 IEEE International Conference on
Conference_Location :
Macao
ISSN :
2157-3611
Print_ISBN :
978-1-4244-8501-7
Electronic_ISBN :
2157-3611
Type :
conf
DOI :
10.1109/IEEM.2010.5674509
Filename :
5674509
Link To Document :
بازگشت