• DocumentCode
    1829314
  • Title

    A new tool development for the thermal design and quick performance evaluation of D2-FBGA devices

  • Author

    Ore, Siew Hoon ; Gan, Kian Yeow ; Tamil, Jonathan ; Suthiwongsunthorn, Nathapong ; Chungpaiboonpatana, Surasit

  • Author_Institution
    United Test & Assembly Center Ltd., Singapore, Singapore
  • fYear
    2011
  • fDate
    7-9 Dec. 2011
  • Firstpage
    714
  • Lastpage
    721
  • Abstract
    We have developed solutions for the quick assessment of the D2-FBGA thermal performance to meet the rising demands for shorter cycle times to provide thermal solutions. D2-FBGA package has multiple devices packaged within the same footprint which can result in higher temperatures. Thus thermal management and characterization of stacked die packages is vital. We have designed a user friendly tool that provides a quick estimation of the junction to ambient thermal resistance of the D2-FBGA package under JEDEC test conditions (JESD 51-2 and JESD 51-6). Results can be obtained within minutes by a click of a button after the simple entry of key package and environmental data. This tool significantly reduces the time for thermal evaluation; from hours or days for conducting full Computational Fluid Dynamics (CFD) simulations, to minutes by using the tool. It can also be used for upfront thermal design, to assess the thermal impact due to changes in various package factors such as package size, die sizes, die powers, die attach material and thickness, solder balls under the die area and substrate details. The tool can also assess the impact due to changes in wind speed and test board. With these features, the tool can quickly estimate if the package meets the thermal requirement, and if it fails, quickly identify potential thermal solutions.
  • Keywords
    computational fluid dynamics; thermal management (packaging); thermal resistance; CFD simulations; D2-FBGA devices; JEDEC test conditions; JESD 51-2; JESD 51-6; computational fluid dynamics; performance evaluation; stacked die packages; thermal design; thermal management; thermal resistance; Computational fluid dynamics; Electronic packaging thermal management; Heat transfer; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging Technology Conference (EPTC), 2011 IEEE 13th
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4577-1983-7
  • Electronic_ISBN
    978-1-4577-1981-3
  • Type

    conf

  • DOI
    10.1109/EPTC.2011.6184512
  • Filename
    6184512