Title :
Reliability of Press Fit Contacts and Adjoining SMD Components on Printed Circuit Boards
Author :
Ring, Karl ; Schreier-Alt, Thomas
Keywords :
Capacitive sensors; Chip scale packaging; Contacts; Electronic components; Electronics packaging; Pins; Printed circuits; Surface fitting; Thermal loading; Thermal stresses;
Conference_Titel :
Electrical Contacts, 2009 Proceedings of the 55th IEEE Holm Conference on
Conference_Location :
Vancouver, British Columbia, Canada
Print_ISBN :
978-1-4244-3613-2
Electronic_ISBN :
978-1-4244-3613-2
DOI :
10.1109/HOLM.2009.5284396