Title :
Real time defect detection using image segmentation
Author :
Miteran, Johel ; Geveaux, Pierre ; Bailly, Rémy ; Gorria, Patrick
Author_Institution :
Univ. of Bergundy, Le Creusot, France
Abstract :
The authors present in this paper the realization of a classification board, for real-time defect detection on industrial products, using image segmentation. The classification of each pixel is completed using a real-time extraction of attributes and a geometric classification method by stress polytope training, which ensures a high decision speed (100 ns per pixels) and good performances. The decision operator has been integrated in the form of a full custom circuit, and the extraction of parameters is performed using a single high density FPGA. The industrial product can be then high-level classified using the area of the defect
Keywords :
automatic optical inspection; computerised instrumentation; field programmable gate arrays; image classification; image segmentation; quality control; real-time systems; FPGA; classification board; computational performance; decision operator; decision speed; geometric classification method; image segmentation; industrial products; quality assurance; real-time attributes extraction; real-time defect detection; stress polytope training; Application specific integrated circuits; Electronic mail; Field programmable gate arrays; Image segmentation; Industrial training; Laboratories; Manufacturing automation; Manufacturing industries; Merging; Stress;
Conference_Titel :
Industrial Electronics, 1997. ISIE '97., Proceedings of the IEEE International Symposium on
Conference_Location :
Guimaraes
Print_ISBN :
0-7803-3936-3
DOI :
10.1109/ISIE.1997.649082