DocumentCode
1829374
Title
A static pattern-independent technique for power grid voltage integrity verification
Author
Kouroussis, Dionysios ; Najm, Farid N.
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Toronto, Ont.
fYear
2003
fDate
2003
Firstpage
99
Lastpage
104
Abstract
Design verification must be included the power grid. Checking that the voltage on the power grid does not drop by more than some critical threshold is a very difficult problem, for at least two reasons: 1. the obviously large size of the power grids for modern high-performance chips, and 2. the difficulty of setting up the right simulation conditions for the power grid that provide some measure of a realistic worst case voltage drop. The huge number of possible circuit operational modes or workloads makes it impossible to do exhaustive analysis. We propose a static technique for power grid verification, where static is in the sense of static timing analysis, meaning that it does not depend on, nor require, user-specified stimulus to drive a simulation. The verification is posed as an optimization problem under user-supplied current constraints. We propose that current constraints are the right kind of abstraction to use in order to develop a practical methodology for power grid verification. We present our verification approach, and report on the results of applying it to a number of test-case power grids
Keywords
integrated circuit modelling; integrated logic circuits; power supply circuits; timing circuits; voltage control; voltage regulators; circuit operational modes; current constraints; high-performance chips; ower grid verification; power grid voltage; static pattern-independent technique; static timing analysis; voltage integrity verification; Algorithm design and analysis; Analytical models; Circuit simulation; Network-on-a-chip; Permission; Power grids; Power measurement; Threshold voltage; Timing; Voltage fluctuations;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 2003. Proceedings
Conference_Location
Anaheim, CA
Print_ISBN
1-58113-688-9
Type
conf
DOI
10.1109/DAC.2003.1218834
Filename
1218834
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