• DocumentCode
    1829374
  • Title

    A static pattern-independent technique for power grid voltage integrity verification

  • Author

    Kouroussis, Dionysios ; Najm, Farid N.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Toronto, Ont.
  • fYear
    2003
  • fDate
    2003
  • Firstpage
    99
  • Lastpage
    104
  • Abstract
    Design verification must be included the power grid. Checking that the voltage on the power grid does not drop by more than some critical threshold is a very difficult problem, for at least two reasons: 1. the obviously large size of the power grids for modern high-performance chips, and 2. the difficulty of setting up the right simulation conditions for the power grid that provide some measure of a realistic worst case voltage drop. The huge number of possible circuit operational modes or workloads makes it impossible to do exhaustive analysis. We propose a static technique for power grid verification, where static is in the sense of static timing analysis, meaning that it does not depend on, nor require, user-specified stimulus to drive a simulation. The verification is posed as an optimization problem under user-supplied current constraints. We propose that current constraints are the right kind of abstraction to use in order to develop a practical methodology for power grid verification. We present our verification approach, and report on the results of applying it to a number of test-case power grids
  • Keywords
    integrated circuit modelling; integrated logic circuits; power supply circuits; timing circuits; voltage control; voltage regulators; circuit operational modes; current constraints; high-performance chips; ower grid verification; power grid voltage; static pattern-independent technique; static timing analysis; voltage integrity verification; Algorithm design and analysis; Analytical models; Circuit simulation; Network-on-a-chip; Permission; Power grids; Power measurement; Threshold voltage; Timing; Voltage fluctuations;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2003. Proceedings
  • Conference_Location
    Anaheim, CA
  • Print_ISBN
    1-58113-688-9
  • Type

    conf

  • DOI
    10.1109/DAC.2003.1218834
  • Filename
    1218834