DocumentCode :
1829379
Title :
A novel Wafer level Fan-out Package (WFOP™) applicable to 50um pad pitch interconnects
Author :
Hayashi, Naoki ; Takahashi, Tomoko ; Shintani, Nobuaki ; Kondo, Takanori ; Marutani, Hisakazu ; Takehara, Yasuyuki ; Higaki, Kiichiro ; Yamagata, Osamu ; Yamaji, Yasuhiro ; Katsumata, Akio ; Hiruta, Yoichi
Author_Institution :
Packaging R&D Center, J-Devices Corp., Kawasaki, Japan
fYear :
2011
fDate :
7-9 Dec. 2011
Firstpage :
730
Lastpage :
733
Abstract :
We present a new embedded package structure and technology for the next generation of WLP, the Wafer level Fun-Out Package; WFOP™. That is one of the face-down mounting styles, which has metal plate like stainless or copper as a base plate of redistributed interconnection layer. The redistributed layer is fabricated with semi-additive method of copper plating. The contact type between the die pads and distributed layer is the lead-type. This structure is hopeful to reduction of fabrication cost by using large scale panel and precise redistribution interconnects control, and its design rule does not depend on the die size. Moreover, WFOP™ has several benefits; applicable to 50μm pad pitch, an excellent thermal characteristics and noise shield by attaching the metal plate. And we obtained the fine results of reliability test. In this paper, we report its package structure, process flow, package characteristics and reliability test results and discussion.
Keywords :
integrated circuit interconnections; integrated circuit reliability; wafer level packaging; WFOP; base plate; copper plating; die pads; die size; distributed layer; embedded package structure; fabrication cost reduction; face-down mounting styles; lead-type contact; metal plate; noise shield; package structure; pad pitch interconnects; redistributed interconnection layer; redistribution interconnects control; reliability test; semiadditive method; thermal characteristics; wafer level fan-out package; Accuracy; Copper; Electronics packaging; Fabrication; Reliability; Resins;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Packaging Technology Conference (EPTC), 2011 IEEE 13th
Conference_Location :
Singapore
Print_ISBN :
978-1-4577-1983-7
Electronic_ISBN :
978-1-4577-1981-3
Type :
conf
DOI :
10.1109/EPTC.2011.6184515
Filename :
6184515
Link To Document :
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