DocumentCode :
1829381
Title :
Investigation of Dust Test and Modeling of Dusts Ingression
Author :
Wang, Dong ; Xu, Liang Jun ; Lu, Na
fYear :
2009
fDate :
14-16 Sept. 2009
Firstpage :
220
Lastpage :
224
Keywords :
Connectors; Contacts; Electromagnetic devices; Electronic equipment testing; Finite element methods; Gravity; Mobile handsets; Optical microscopy; Performance evaluation; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Contacts, 2009 Proceedings of the 55th IEEE Holm Conference on
Conference_Location :
Vancouver, British Columbia, Canada
Print_ISBN :
978-1-4244-3613-2
Electronic_ISBN :
978-1-4244-3613-2
Type :
conf
DOI :
10.1109/HOLM.2009.5284399
Filename :
5284399
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1829381
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