Title :
Kerr lens effects on transverse mode stability and active versus passive modelocking in solid state lasers
Author :
Staver, P. Randall ; Lotshaw, William T.
Author_Institution :
Gen. Electr. Corp. Res. & Dev. Center, Schenectady, NY, USA
Abstract :
Summary form only given. The effects of the nonlinear refractive index as a discriminant between the lowest order transverse mode stability in the passively mode locked and cw operating modes of tunable, solid state laser crystals, have received much recent attention. This attention has focused primarily on the intensity dependent focal power in the laser crystal due to the (mostly) nonresonant refractive index and the peak intensity of the oscillating resonator mode. In this report we extend these studies to include resonant and nonresonant refractive index effects due to a synchronous pump laser, and to examine the possibility that the magnitudes, signs, and time dependences of the pump and oscillating wavelength effects could be manipulated to discriminate between active versus passive modelocking of the tunable laser output, as well as between cw and passive modelocked operation
Keywords :
laser cavity resonators; laser mode locking; laser modes; laser stability; optical Kerr effect; optical pumping; refractive index; solid lasers; Kerr lens effects; active modelocking; cw operating modes; intensity dependent focal power; laser crystal; lowest order transverse mode stability; nonlinear refractive index; nonresonant refractive index; nonresonant refractive index effects; oscillating resonator mode; oscillating wavelength effects; passive modelocking; peak intensity; resonant refractive index effects; solid state lasers; synchronous pump laser; transverse mode stability; tunable laser output; tunable solid state laser crystals; Crystals; Laser excitation; Laser mode locking; Laser modes; Laser stability; Lenses; Pump lasers; Refractive index; Solid lasers; Tunable circuits and devices;
Conference_Titel :
Nonlinear Optics: Materials, Fundamentals, and Applications, 1994. NLO '94 IEEE
Conference_Location :
Waikoloa, HI
Print_ISBN :
0-7803-1473-5
DOI :
10.1109/NLO.1994.470785