DocumentCode

1829456

Title

The Impact of Spot Size and Location on Current Density

Author

Malucci, Robert D.

fYear

2009

fDate

14-16 Sept. 2009

Firstpage

208

Lastpage

213

Keywords

Accelerated aging; Acceleration; Aluminum; Contact resistance; Copper; Current density; Degradation; Equations; Heating; Tin;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical Contacts, 2009 Proceedings of the 55th IEEE Holm Conference on

Conference_Location

Vancouver, British Columbia, Canada

Print_ISBN

978-1-4244-3613-2

Electronic_ISBN

978-1-4244-3613-2

Type

conf

DOI

10.1109/HOLM.2009.5284401

Filename

5284401