Title :
ATE power innovation for the 90´s
Author :
Krowitz, Michael B.
Author_Institution :
Elgar Electron., San Diego, CA, USA
Abstract :
Novel technologies in automatic test equipment (ATE) systems are discussed, along with their implementation in the distribution of precision system power, unit-under-test (UUT) power stimuli and how this technology can reduce cost, improve reliability/efficiency and minimize size and weight is described. Existing and proposed technology related to integrated diagnostics with embedded repair routines for system and UUT power are also described
Keywords :
automatic test equipment; automatic testing; electronic equipment testing; power supplies to apparatus; technological forecasting; 1990s; ATE; UUT; cost; integrated diagnostics; power stimuli; reliability/efficiency; size; unit-under-test; weight; Costs; Electronic equipment testing; Instruments; Marketing and sales; Power engineering and energy; Power supplies; Power system management; Power system reliability; System testing; Technological innovation;
Conference_Titel :
AUTOTESTCON '88. IEEE International Automatic Testing Conference, Futuretest. Symposium Proceedings
Conference_Location :
Minneapolis, MN
DOI :
10.1109/AUTEST.1988.9625
