DocumentCode
1829497
Title
ATE power innovation for the 90´s
Author
Krowitz, Michael B.
Author_Institution
Elgar Electron., San Diego, CA, USA
fYear
1988
fDate
4-6 Oct 1988
Firstpage
301
Lastpage
302
Abstract
Novel technologies in automatic test equipment (ATE) systems are discussed, along with their implementation in the distribution of precision system power, unit-under-test (UUT) power stimuli and how this technology can reduce cost, improve reliability/efficiency and minimize size and weight is described. Existing and proposed technology related to integrated diagnostics with embedded repair routines for system and UUT power are also described
Keywords
automatic test equipment; automatic testing; electronic equipment testing; power supplies to apparatus; technological forecasting; 1990s; ATE; UUT; cost; integrated diagnostics; power stimuli; reliability/efficiency; size; unit-under-test; weight; Costs; Electronic equipment testing; Instruments; Marketing and sales; Power engineering and energy; Power supplies; Power system management; Power system reliability; System testing; Technological innovation;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON '88. IEEE International Automatic Testing Conference, Futuretest. Symposium Proceedings
Conference_Location
Minneapolis, MN
Type
conf
DOI
10.1109/AUTEST.1988.9625
Filename
9625
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