• DocumentCode
    1829500
  • Title

    Assessment of the spatial resolution of PET scanners using a Geant4-based Monte Carlo tool

  • Author

    Fiedler, Klaus ; Frach, Thomas ; Rütten, Walter ; Solf, Torsten ; Thon, Andreas

  • Author_Institution
    Philips Res. Lab., Aachen, Germany
  • Volume
    4
  • fYear
    2003
  • fDate
    19-25 Oct. 2003
  • Firstpage
    2549
  • Abstract
    In this paper, the spatial resolution of PET scanners is assessed by means of a Geant4-based Monte Carlo tool. To obtain a high level of accuracy, all relevant contributions like β+ range and gamma noncollinearity, crystal size and material, intercrystal scatter, and scanner geometry are implemented in detail. For a system based on Anger logic, the scintillator light yield, the photon statistics and the PMT characteristics are also taken into account. In the simulation, Monte Carlo and analytical algorithms share a common setup, which allows for the necessary computation speed to generate clinical count statistics without compromising accuracy. In the first part, the major contributions to the spatial resolution are analyzed separately. The impact on the total system resolution is then illustrated by investigating three scanner designs with different gantry sizes, crystal sizes, crystal materials and β+ tracers.
  • Keywords
    Monte Carlo methods; geometry; photomultipliers; positron emission tomography; solid scintillation detectors; Anger logic; Geant4-based Monte Carlo tool; PET scanners; PMT characteristics; beta+ range; beta+ tracers; clinical count statistics; crystal materials; crystal size; gamma noncollinearity; gantry size; intercrystal scatter; photon statistics; scanner design; scanner geometry; scintillator light yield; spatial resolution; Crystalline materials; Geometry; Light scattering; Logic; Monte Carlo methods; Particle scattering; Photonic crystals; Positron emission tomography; Spatial resolution; Statistics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record, 2003 IEEE
  • ISSN
    1082-3654
  • Print_ISBN
    0-7803-8257-9
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2003.1352410
  • Filename
    1352410