• DocumentCode
    1829620
  • Title

    Residual-based inspection/replacement policy for a deteriorating system with Markovian covariates

  • Author

    Zhao, Xuejing ; Fouladirad, Mitra ; Bérenguer, Christophe

  • Author_Institution
    Sch. of Math. & Stat., Lanzhou Univ., Lanzhou, China
  • fYear
    2010
  • fDate
    7-10 Dec. 2010
  • Firstpage
    636
  • Lastpage
    640
  • Abstract
    This paper investigates a residual-based maintenance policy for a stochastic deteriorating system, which is influenced by a Markovian covariates process. The baseline stochastic deterioration is modeled by a Gamma process, and the covariates process is assumed to be a time-homogeneous finite-state Markov chain. A model similar to the proportional hazards model is used to represent the influence of the covariates. A residual-based inspection scheme, depending on the degradation level as well as the covariates state, is proposed. We derive the optimal maintenance threshold, optimal inspection scheme to minimize the expected average maintenance cost. By Monte Carlo simulations the efficiency of our method is studied.
  • Keywords
    Markov processes; Monte Carlo methods; costing; inspection; maintenance engineering; minimisation; Gamma process; Markovian covariates process; Monte Carlo simulation; expected average maintenance cost minimization; optimal inspection scheme; optimal maintenance threshold; proportional hazards model; replacement policy; residual-based inspection policy; residual-based maintenance policy; stochastic deteriorating system; time-homogeneous finite-state Markov chain; Degradation; Hazards; Inspection; Maintenance engineering; Markov processes; Numerical simulation; Deterioration; Gamma process; Markovian covariates; condition-based maintenance; mean residual lifetime;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Engineering and Engineering Management (IEEM), 2010 IEEE International Conference on
  • Conference_Location
    Macao
  • ISSN
    2157-3611
  • Print_ISBN
    978-1-4244-8501-7
  • Electronic_ISBN
    2157-3611
  • Type

    conf

  • DOI
    10.1109/IEEM.2010.5674526
  • Filename
    5674526