Title :
Artificial Low Current Arc Fault for Pattern Recognition in Low Voltage Switchgear
Author :
Müller, Peter ; Tenbohlen, Stefan ; Maier, Reinhard ; Anheuser, Michael
Keywords :
Circuit faults; Circuit testing; Contamination; Electrical fault detection; Fault detection; Fuses; Low voltage; Pattern recognition; Protection; Switchgear;
Conference_Titel :
Electrical Contacts, 2009 Proceedings of the 55th IEEE Holm Conference on
Conference_Location :
Vancouver, British Columbia, Canada
Print_ISBN :
978-1-4244-3613-2
Electronic_ISBN :
978-1-4244-3613-2
DOI :
10.1109/HOLM.2009.5284429