• DocumentCode
    1830191
  • Title

    Characterization of responsivity and quantum efficiency of TiO2—Based photodetectors doped with Ag nanoparticles

  • Author

    Nejad, S. Mohammad ; Samani, S.G. ; Rahimi, E.

  • Author_Institution
    Nanoptronics Res. Center, Iran Univ. of Sci. & Technol., Tehran, Iran
  • Volume
    2
  • fYear
    2010
  • fDate
    1-3 Aug. 2010
  • Abstract
    There is a motivation to reduce the thickness of photodetectors to improve the efficiency of extracting executed carrier. However, reducing the thickness of thin film also reduces the amount of light absorbed. To alleviate this problem we can use light trapping. Ag Nanoparticles with specific diameters are exposed to improve optical characteristics of TiO2-based photodetectors. Optical properties of photodetectors depend on optical properties of nanoparticles. There for photodetectore application we need to identify which of these properties (scattering, absorption) are beneficial and then design suitable nanoparticle to maximize these effect while minimizing unwanted optical properties. Nanoparticles diameter is usually between 5-100 nm. If the diameter of nanoparticles is about more than 100 nm, light will not be absorbed efficiently, and when it is smaller than 5 nm, charge transition through channels fades and scattering is increased. Effect of nanoparticles on absorption coefficient, quantum efficiency, and responsivity of photodetectors based on TiO2 are discussed in this paper.
  • Keywords
    nanoparticles; optical properties; photodetectors; quantum optics; silver compounds; thin films; titanium compounds; Ag nanoparticles; Ag:TiO2; absorption coefficient; charge transition; excuted carrier extraction; light trapping; nanoparticle diameter; optical property; photodetectors; quantum efficiency; responsivity characterization; size 5 nm to 100 nm; thin film thickness; Absorption coefficient; Nanoparticle(NP); Quantum Efficiency(QE); Responsivity(R);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Mechanical and Electronics Engineering (ICMEE), 2010 2nd International Conference on
  • Conference_Location
    Kyoto
  • Print_ISBN
    978-1-4244-7479-0
  • Electronic_ISBN
    978-1-4244-7481-3
  • Type

    conf

  • DOI
    10.1109/ICMEE.2010.5558400
  • Filename
    5558400