Title :
Scanning force microscopy investigations on electroactive polymer films
Author :
Sturm, H. ; Geub, M. ; Schulz, E.
Author_Institution :
Fed. Inst. for Mater. Res. & Testing, Berlin, Germany
Abstract :
The authors present investigations on a PVDF (polyvinylidenefluoride) film supplied with top and bottom Au electrodes, which is analysed using a SFM and a contactless optical sensor to measure the sample strain with respect to applied fields
Keywords :
atomic force microscopy; electrets; piezoelectric thin films; polymer films; strain measurement; Au; Au electrodes; PVDF; SFM; applied fields; contactless optical sensor; electrets; electroactive polymer films; polyvinylidenefluoride; scanning force microscopy; strain measurement; Calibration; Capacitive sensors; Electrodes; Gold; Optical fiber sensors; Piezoelectric films; Polymer films; Scanning electron microscopy; Strain measurement; Surface topography;
Conference_Titel :
Electrets, 1999. ISE 10. Proceedings. 10th International Symposium on
Conference_Location :
Athens
Print_ISBN :
0-7803-5025-1
DOI :
10.1109/ISE.1999.832086
