• DocumentCode
    1830272
  • Title

    Linearity analysis of CMOS for RF application

  • Author

    Sanghoon Kang ; Byounggi Choi ; Bumman Kim

  • Author_Institution
    Dept. of Electron. & Electr. Eng., Pohang Univ. of Sci. & Technol., South Korea
  • Volume
    1
  • fYear
    2002
  • fDate
    2-7 June 2002
  • Firstpage
    279
  • Abstract
    The linearity of CMOS is analyzed. Transconductance and output conductance are two dominant nonlinear sources of CMOS. Capacitances and substrate leakage network do not generate any significant distortions. But they reduce the output impedance for the best linearity and the power gain at a high frequency and the output conductance nonlinearity is significantly at a high frequency. Up to a few GHz, the output conductance is the dominant nonlinear source, and at a higher frequency, the transconductance is the dominant nonlinearity source. OIP3 is reduced by the effects of those components. OIP3s are calculated for various gate length processes. CMOS linearity is dependent only on current density and drain bias voltage but is not dependent on gate length.
  • Keywords
    CMOS integrated circuits; CMOS circuit; OIP3; RF IC; capacitance; distortion; linearity analysis; nonlinearity; output conductance; output impedance; power gain; substrate leakage; transconductance; CMOS process; CMOS technology; Capacitance; Impedance; Linearity; Radio frequency; Semiconductor device modeling; Taylor series; Transconductance; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2002 IEEE MTT-S International
  • Conference_Location
    Seattle, WA, USA
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-7239-5
  • Type

    conf

  • DOI
    10.1109/MWSYM.2002.1011611
  • Filename
    1011611