DocumentCode
1830356
Title
Introducing Complex Oscillation Based Test: an application example targeting Analog to Digital Converters
Author
Callegari, Sergio
Author_Institution
ARCES & DEIS, Univ. of Bologna, Bologna
fYear
2008
fDate
18-21 May 2008
Firstpage
320
Lastpage
323
Abstract
This paper extends conventional Oscillation Based Test (OBT) methodologies to Complex Oscillation Based Test (COBT) that takes advantage of chaotic dynamics rather than classical oscillation regimes. The underlying concepts of COBT are presented in an operative way, discussing application to Analog to Digital Converters (ADCs). Circuit architectures are illustrated together with mathematical justification and preliminary results.
Keywords
analogue-digital conversion; circuit oscillations; analog to digital converters; chaotic dynamics; circuit architectures; complex oscillation based test; Analog-digital conversion; Automatic testing; Chaos; Circuit faults; Circuit testing; Fault detection; Feedback loop; Frequency; Hardware; Signal processing;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 2008. ISCAS 2008. IEEE International Symposium on
Conference_Location
Seattle, WA
Print_ISBN
978-1-4244-1683-7
Electronic_ISBN
978-1-4244-1684-4
Type
conf
DOI
10.1109/ISCAS.2008.4541419
Filename
4541419
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