DocumentCode
1830585
Title
Texture Measure from Low Resolution MR Images to Determine Trabecular Bone Integrity in Osteoporosis
Author
Tameem, H.Z. ; Selva, L.E. ; Sinha, U.S.
Author_Institution
Univ. of California, Los Angeles
fYear
2007
fDate
22-26 Aug. 2007
Firstpage
2027
Lastpage
2030
Abstract
Bone architectural information can be derived from structural indices calculated from high resolution magnetic resonance (MR) images. However, high resolution scans are time consuming and prone to motion artifacts and hence are not routinely feasible. The purpose of this study is to determine if a correlation exists between 3D structural indices calculated from high-resolution MR images and 3D cooccurrence texture features calculated from lower resolution MR images. Regression analysis indicates a strong correlation between the structural indices and the texture features. This study highlights the potential of using surrogate texture markers extracted from readily acquired clinical MR images to quantify bone architecture, circumventing the need for high resolution MR imaging.
Keywords
biomedical MRI; bone; diseases; image resolution; image texture; medical image processing; orthopaedics; regression analysis; 3D structural indices calculation; bone architectural information; bone architecture quantification; clinical MR images; high resolution magnetic resonance images; image texture; low resolution MR images; motion artifacts; osteoporosis; regression analysis; trabecular bone integrity; Biomedical imaging; Biomedical informatics; Biomedical measurements; Cancellous bone; Computed tomography; High-resolution imaging; Image analysis; Image resolution; Image texture analysis; Osteoporosis; Algorithms; Bone Density; Bone and Bones; Equipment Design; Humans; Image Processing, Computer-Assisted; Imaging, Three-Dimensional; Magnetic Resonance Imaging; Motion; Osteoporosis; Regression Analysis; Research Design; Software;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 2007. EMBS 2007. 29th Annual International Conference of the IEEE
Conference_Location
Lyon
ISSN
1557-170X
Print_ISBN
978-1-4244-0787-3
Type
conf
DOI
10.1109/IEMBS.2007.4352717
Filename
4352717
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