Title :
Electrical characterization and application of very high speed vertical cavity surface emitting lasers (VCSELs)
Author :
Hietala, V.M. ; Lear, K.L. ; Armendariz, M.G. ; Tigges, C.P. ; Hou, H.Q. ; Zolper, J.C.
Author_Institution :
Sandia Nat. Labs., Albuquerque, NM, USA
Abstract :
Vertical Cavity Surface Emitting Lasers (VCSELs) offer many benefits over conventional edge-emitting lasers including economical microelectronic batch processing, easy extension to 2-D arrays, and of interest here, very large intrinsic bandwidths due to reduced cavity volume. Results of electrical characterization of a 19 GHz bandwidth 850 nm VCSEL are presented. Small-signal characterization and modeling of the frequency response and device impedance is presented. Large signal performance is studied using two-tone RF and high-speed digital measurements. Appropriate drive conditions for high-speed digital applications are demonstrated.
Keywords :
frequency response; optical communication equipment; optical fibre communication; semiconductor lasers; surface emitting lasers; 19 GHz; 850 nm; device impedance; drive conditions; frequency response; high-speed digital measurements; intrinsic bandwidths; large signal performance; reduced cavity volume; small-signal characterization; two-tone RF; vertical cavity surface emitting lasers; Bandwidth; Frequency response; Impedance; Laser modes; Microelectronics; Optical arrays; RF signals; Radio frequency; Surface emitting lasers; Vertical cavity surface emitting lasers;
Conference_Titel :
Microwave Symposium Digest, 1997., IEEE MTT-S International
Conference_Location :
Denver, CO, USA
Print_ISBN :
0-7803-3814-6
DOI :
10.1109/MWSYM.1997.604591
