DocumentCode
1830861
Title
Thermal simulation and validation of the fast static RAM 164-lead FC-PBGA package with investigations of package thermal performance in a generic CPU module
Author
Eyman, Mike ; Johnson, Zane ; Joiner, Bennett
Author_Institution
Motorola Inc., Austin, TX, USA
fYear
1998
fDate
25-28 May 1998
Firstpage
62
Lastpage
69
Abstract
The steady-state thermal performance of the 164-lead flip chip plastic ball grid array (FC-PBGA) under low to moderate convective air cooling conditions has been simulated through finite element (FE) methods and computational fluid dynamics (CFD) methods. Experimental measurements taken with thermal test vehicles of this package were used to validate the simulations. Packages with three different substrates were investigated. Package performance has been presented in the form of a linear relationship between the normalized junction-to-ambient thermal resistance (θJA) versus the normalized board-to-ambient thermal parameter (ψBA). Results cast in this form represent a first-order thermal figure of merit for packages. Such a figure of merit can be used to rank in a consistent manner the thermal performance of different package types. A CFD study was performed to investigate the thermal performance of the package on a central processing unit (CPU) module assembly. A parametric study was performed to investigate the die temperatures as a function of thermal interface materials and heat sink configuration. Sink solutions were studied. The results of those board-level simulations give a reasonable indication of how the package would perform in a workstation environment
Keywords
SRAM chips; cooling; finite element analysis; flip-chip devices; heat sinks; integrated circuit packaging; microprocessor chips; modules; plastic packaging; thermal resistance; CPU module; FC-PBGA package; board-to-ambient thermal parameter; computational fluid dynamics; convective air cooling; die temperature; figure of merit; finite element simulation; flip chip plastic ball grid array; heat sink; junction-to-ambient thermal resistance; static RAM; thermal interface material; workstation; Central Processing Unit; Computational fluid dynamics; Computational modeling; Cooling; Electronics packaging; Finite element methods; Flip chip; Plastics; Steady-state; Thermal resistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components & Technology Conference, 1998. 48th IEEE
Conference_Location
Seattle, WA
ISSN
0569-5503
Print_ISBN
0-7803-4526-6
Type
conf
DOI
10.1109/ECTC.1998.678672
Filename
678672
Link To Document