DocumentCode :
1830866
Title :
A Software-hardware Collaborating Framework for Wear Leveling on Phase Change Memory
Author :
Yu, Licheng ; Chen, Tianzhou ; Wu, Jianzhong
Author_Institution :
Coll. of Comput. Sci. & Technol., Zhejiang Univ., Hangzhou, China
fYear :
2012
fDate :
25-27 June 2012
Firstpage :
1360
Lastpage :
1367
Abstract :
DRAM has been used as main memory in most systems, but its scalability and energy consumption are difficult to improve because of its architecture nature. Phase change memory (PCM) is a new non-volatile memory, which addresses these problems and is a promising candidate to replace DRAM as main memory. Since PCM cell has a very limited lifetime, many hardware methods have been proposed to improve its endurance with only low-level information about physical memory operations. Meanwhile, operating system manages physical page mapping, and it has the knowledge of memory layout as well as memory requirements of each process. This paper investigates write behaviors of different memory areas of processes, and proposes a software-hardware collaborating framework that captures process write behavior with simple hardware to enable process write behavior predication by operating system. The framework combines operating system and PCM controller that exploits write behaviors of processes to aid in PCM wear leveling. The results show this framework helps reduce PCM page swaps for wear leveling by 63% on average. And it also lowers the writes of the most worn page by 12% with single process, and by 21% with two parallel processes sharing the PCM.
Keywords :
DRAM chips; energy consumption; hardware-software codesign; operating systems (computers); parallel memories; phase change memories; random-access storage; DRAM; PCM; energy consumption; memory requirement; nonvolatile memory; operating system; page swap; parallel processes; phase change memory; physical page mapping management; software-hardware collaborating framework; wear leveling; Benchmark testing; Memory management; Operating systems; Phase change materials; Radiation detectors; Random access memory; Resource management; operating system; phase change memory; process write behavior; wear leveling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
High Performance Computing and Communication & 2012 IEEE 9th International Conference on Embedded Software and Systems (HPCC-ICESS), 2012 IEEE 14th International Conference on
Conference_Location :
Liverpool
Print_ISBN :
978-1-4673-2164-8
Type :
conf
DOI :
10.1109/HPCC.2012.200
Filename :
6332336
Link To Document :
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