Title :
Single-stage boost inverter reliability in solar photovoltaic applications
Author :
Hofreiter, Eric ; Bazzi, Ali M.
Abstract :
The boost inverter presents an interesting topology for solar photovoltaic (PV) applications as a single stage that provides regulated, boosted, and inverted output voltage from a nonlinear dc input. While the boost inverter has been previously addressed from design, implementation, and control perspectives, this paper analyzes its fault modes, failures, and reliability. The inverter is first experimentally tested to validate a simulation model used in the reliability analysis. The simulation model is then used to analyze the effect of various faults on the system performance. Results of this analysis yield a Markov reliability model from which the mean-time-to-failure (MTTF) of the inverter is found. Results show that the boost inverter can be a very reliable topology with low component count for PV applications.
Keywords :
Markov processes; invertors; photovoltaic power systems; power generation reliability; solar power stations; MTTF; Markov reliability model; fault modes; mean-time-to-failure; single-stage boost inverter reliability analysis; solar PV applications; solar photovoltaic applications; Analytical models; Circuit faults; Inverters; Load modeling; Photovoltaic systems; Reliability; Topology; boost inverter; microinverter; solar photovoltaic inverter;
Conference_Titel :
Power and Energy Conference at Illinois (PECI), 2012 IEEE
Conference_Location :
Champaign, IL
Print_ISBN :
978-1-4577-1681-2
Electronic_ISBN :
978-1-4577-1682-9
DOI :
10.1109/PECI.2012.6184601