• DocumentCode
    1831226
  • Title

    Analysis of failure correlation impact on peer-to-peer storage systems

  • Author

    Dalle, Olivier ; Giroire, Frédéric ; Monteiro, Julian ; Pérennes, Stéphane

  • Author_Institution
    Univ. of Nice - Sophia Antipolis, Sophia Antipolis, France
  • fYear
    2009
  • fDate
    9-11 Sept. 2009
  • Firstpage
    184
  • Lastpage
    193
  • Abstract
    Peer-to-peer storage systems aim to provide a reliable long-term storage at low cost. In such systems, peers fail continuously, hence, the necessity of self-repairing mechanisms to achieve high durability. In this paper, we propose and study analytical models that assess the bandwidth consumption and the probability to lose data of storage systems that use erasure coded redundancy. We show by simulations that the classical stochastic approach found in the literature, that models each block independently, gives a correct approximation of the system average behavior, but fails to capture its variations over time. These variations are caused by the simultaneous loss of multiple data blocks that results from a peer failing (or leaving the system). We then propose a new stochastic model based on a fluid approximation that better captures the system behavior. In addition to its expectation, it gives a correct estimation of its standard deviation. This new model is validated by simulations.
  • Keywords
    failure analysis; peer-to-peer computing; software reliability; stochastic processes; storage management; analytical models; bandwidth consumption; data loss probability; erasure coded redundancy; failure correlation impact analysis; fluid approximation; peer-to-peer storage systems; selfrepairing mechanisms; standard deviation; stochastic approach; Analytical models; Bandwidth; Computational modeling; Costs; Failure analysis; Maintenance; Peer to peer computing; Predictive models; Redundancy; Stochastic systems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Peer-to-Peer Computing, 2009. P2P '09. IEEE Ninth International Conference on
  • Conference_Location
    Seattle, WA
  • Print_ISBN
    978-1-4244-5066-4
  • Electronic_ISBN
    978-1-4244-5067-1
  • Type

    conf

  • DOI
    10.1109/P2P.2009.5284518
  • Filename
    5284518