Title :
Impact of multipath fading and partial-band interference on the performance of a COFDM/CDMA modulation scheme for robust wireless communications
Author :
Ormondroyd, R.F. ; Al-Susa, E.
Author_Institution :
Commun. & Wireless Networks Group, Cranfield Univ., UK
Abstract :
The performance of a COFDM/CDMA radio communication system in the presence of partial-band jamming is presented where the effects of multipath and additive noise are included. The importance of interleaving and coding is emphasised and their impact on the bit error-rate performance is evaluated. In the first part of the paper, the effect of jamming on a COFDM system is obtained under worst-case conditions. For single tone jamming, the results show that the effect of the jamming signal on the bit error rate is acceptable, even at signal to jamming power ratios as low as -15 dB, when interleaving and convolutional coding is used. For the case where 20% of the transmission spectrum is corrupted by partial-band jamming, it is necessary for the signal to jamming power ratio to be 5 dB or more to achieve an acceptable bit error rate. To provide additional resilience, the case of an OFDM/CDMA scheme is examined where the spread-spectrum process gain is used to provide additional protection against jamming
Keywords :
OFDM modulation; channel coding; code division multiple access; convolutional codes; error statistics; fading channels; interference suppression; jamming; land mobile radio; multipath channels; COFDM; COFDM/CDMA modulation scheme; additive noise; bit error-rate performance; coding; convolutional coding; interleaving; multipath fading; partial-band interference; partial-band jamming; performance; robust wireless communications; signal to jamming power ratios; single tone jamming; spread-spectrum process gain; Additive noise; Bit error rate; Convolution; Convolutional codes; Fading; Interference; Interleaved codes; Jamming; Multiaccess communication; Radio communication;
Conference_Titel :
Military Communications Conference, 1998. MILCOM 98. Proceedings., IEEE
Conference_Location :
Boston, MA
Print_ISBN :
0-7803-4506-1
DOI :
10.1109/MILCOM.1998.722211