Title :
A PVT-variation tolerant fully integrated 60 GHz transceiver for IEEE 802.11ad
Author :
Tsukizawa, T. ; Yoshimoto, Atsushi ; Komori, Hayato ; Miyanaga, K. ; Kitamura, R. ; Morishita, Yu ; Irie, Masatake ; Nagaso, Yoichi ; Watanabe, Toshio ; Takinami, Koji ; Saito, Nobuo
Author_Institution :
Panasonic Corp., Yokohama, Japan
Abstract :
A PVT tolerant fully integrated 60 GHz transceiver for IEEE 802.11ad is presented. By introducing a newly proposed self-sensing LDO, the transceiver adjusts bias currents and the LDO output voltage for the PA to minimize the output power variation while relaxing the hot carrier injection (HCI) degradation. The measurement shows excellent robustness against PVT variations, demonstrating only 5 dB output power variation over -20 °C to 85 °C across process corners.
Keywords :
millimetre wave power amplifiers; radio transceivers; wireless LAN; HCI degradation; IEEE 802.11ad; LDO output voltage; PVT-variation tolerance; bias current; frequency 60 GHz; fully-integrated transceiver; hot carrier injection degradation; self-sensing LDO; temperature -20 degC to 85 degC; CMOS integrated circuits; Gain; Human computer interaction; Power amplifiers; Power generation; Temperature measurement; Transceivers;
Conference_Titel :
VLSI Circuits Digest of Technical Papers, 2014 Symposium on
Conference_Location :
Honolulu, HI
Print_ISBN :
978-1-4799-3327-3
DOI :
10.1109/VLSIC.2014.6858416
