Title :
ESD protection design for 900-MHz RF receiver with 8-kV HBM ESD robustness
Author :
Ming-Dou Ker ; Wen-Yu Lo ; Chien-Ming Lee ; Chia-Pei Chen ; Hong-Sing Kao
Author_Institution :
Integrated Circuits & Syst. Lab., Nat. Chiao-Tung Univ., Hsinchu, Taiwan
Abstract :
This paper presents a state-of-art ESD protection design for an RF circuit with a human-body-model (HBM) ESD robustness of 8 kV. By including a turn on efficient power-rails clamp circuit into the RF circuit, the ESD clamp devices of the RF input pin are operated in the forward-biased conduction, rather than the traditional junction breakdown condition Therefore, the dimension of ESD devices for the RF input pin can be further downsized to reduce the input capacitance loading for the RF signal. This design has been successfully applied in a 900-MHz RF receiver and fabricated in 0.25-/spl mu/m CMOS process with a thick top metal layer. The experimental results have confirmed that its ESD robustness is as high as >8 kV under the HBM ESD test.
Keywords :
CMOS digital integrated circuits; UHF integrated circuits; electrostatic discharge; impedance matching; integrated circuit design; integrated circuit noise; microwave receivers; protection; 0.25 micron; 8 kV; 900 MHz; 900-MHz RF receiver; CMOS process; ESD clamp devices; ESD protection design; HBM ESD robustness; RF input pin; forward-biased conduction; human-body-model ESD robustness; impedance matching; input capacitance loading; noise figure; power gain; thick top metal layer; turn on efficient power-rails clamp circuit; CMOS process; Capacitance; Circuits; Clamps; Electric breakdown; Electrostatic discharge; Protection; Radio frequency; Robustness; Testing;
Conference_Titel :
Microwave Symposium Digest, 2002 IEEE MTT-S International
Conference_Location :
Seattle, WA, USA
Print_ISBN :
0-7803-7239-5
DOI :
10.1109/MWSYM.2002.1011675