Title :
Notice of Retraction
An investigation of optical properties of titanium oxide nano layers
Author :
Kangarloo, H. ; Rafizadeh, S.
Author_Institution :
Urmia Branch, Fac. of Sci., I.A.U., Urmia, Iran
Abstract :
Notice of Retraction
After careful and considered review of the content of this paper by a duly constituted expert committee, this paper has been found to be in violation of IEEE´s Publication Principles.
We hereby retract the content of this paper. Reasonable effort should be made to remove all past references to this paper.
The presenting author of this paper has the option to appeal this decision by contacting TPII@ieee.org.
Titanium oxide thin films on glass substrates were prepared by resistance evaporation method under UHV conditions, with different deposition angles 0, 25 and 35 degree in the room temperature. The optical properties of the films were systematically examined, and their optical properties were measured by spectrophotometer in the spectral range of 300 - 1100 nm wave length (UV-VIS). The optical functions as, real part of refractive index (n), imaginary part of refractive index (k), real and imaginary parts of dielectric function ε1, ε2 respectively and absorption coefficient (α), obtained from the Kramers-Kronig analysis of the reflectivity curves. Band-gap energy (Eg) was also estimated for these films.
Keywords :
Kramers-Kronig relations; absorption coefficients; dielectric function; energy gap; nanostructured materials; reflectivity; refractive index; thin films; titanium compounds; ultraviolet spectra; vacuum deposition; visible spectra; Kramers-Kronig analysis; SiO2; TiO2; UHV condition; UV-visible spectrophotometry; absorption coefficient; band-gap energy; dielectric function; glass substrate; nanolayers; optical functions; optical properties; reflectivity; refractive index; resistance evaporation method; spectrophotometry; temperature 293 K to 298 K; thin films; wavelength 300 nm to 1100 nm; Heating; Magnetic films; Substrates; Kramers-Kronig; Optical properties; Titanium oxide;
Conference_Titel :
Mechanical and Electronics Engineering (ICMEE), 2010 2nd International Conference on
Conference_Location :
Kyoto
Print_ISBN :
978-1-4244-7479-0
DOI :
10.1109/ICMEE.2010.5558470
