DocumentCode :
1831871
Title :
EM radiation from interconnected surface-microstrip line structures by a coaxial cable
Author :
Kayano, Yoshiki ; Inoue, Hiroshi
Author_Institution :
Dept. of Electr. & Electron. Eng., Akita Univ., Akita, Japan
fYear :
2009
fDate :
17-21 Aug. 2009
Firstpage :
51
Lastpage :
56
Abstract :
In recent years, effective methods for predicting and suppressing EMI over a broad band are required. In this paper, we focus on an equivalent circuit model for predicting EM radiation from a surface-microstrip line (S-MSL) structure with an interconnection coaxial cable. Firstly, frequency responses of common-mode (CM) current on the interconnection coaxial cable and EM radiation are studied experimentally and compared with FDTD modeling. It was demonstrated that the ground plane of the interconnected PCBs and the interconnection cable are the dominant radiation factor at low frequencies. Secondly, an equivalent circuit model for predicting CM current in the ground-connection model was proposed. The equivalent circuit model is based on consideration of concepts of CM antenna impedance to current- and voltage-driven mechanisms. Its validity was discussed by comparing FDTD simulation results. The good agreement between the predicted and measured results indicates the validity of the equivalent circuit model.
Keywords :
coaxial cables; equivalent circuits; CM antenna impedance; FDTD modeling; FDTD simulation; common-mode current; dominant radiation factor; electromagnetic radiation; equivalent circuit model; frequency response; ground-connection model; interconnected PCB; interconnection coaxial cable; surface-microstrip line structure; Coaxial cables; Electromagnetic interference; Electromagnetic radiation; Equivalent circuits; Finite difference methods; Frequency; Impedance; Integrated circuit interconnections; Predictive models; Time domain analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 2009. EMC 2009. IEEE International Symposium on
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-4266-9
Electronic_ISBN :
978-1-4244-4058-0
Type :
conf
DOI :
10.1109/ISEMC.2009.5284556
Filename :
5284556
Link To Document :
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