Title :
A model-based repository of security and dependability patterns for trusted RCES
Author :
Ziani, Ahmed ; Hamid, B. ; Geisel, Jacob ; Bruel, Jean-Michel
Author_Institution :
IRIT, Univ. of Toulouse, Toulouse, France
Abstract :
The requirement for higher Security and Dependability (S&D) of systems is continuously increasing, even in domains traditionally not deeply involved in such issues. Nowadays, many practitioners express their worries about current S&D software engineering practices. New recommendations should be considered to ground this discipline on two pillars: solid theory and proven principles. We took the second pillar towards software engineering for embedded system applications, focusing on the problem of integrating S&D by design to foster reuse. Model driven approaches combined with patterns can be extremely helpful to deal with these strong requirements. In this work, we present a framework for trusted Resource Constrained Embedded Systems (RCES) development by design, by defining both a model to represent S&D pattern language and an architecture for development tools. The implementation of a repository of S&D patterns and their complementary property models is discussed in detail.
Keywords :
embedded systems; software architecture; specification languages; trusted computing; S&D pattern repository; S-and-D pattern language representation; S-and-D software engineering; architecture model; complementary property models; development tools; embedded system applications; model driven approaches; model-based security-and-dependability pattern repository; proven principles; solid theory; trusted RCES; trusted resource constrained embedded system development; Availability; Context; Embedded systems; Libraries; Security; Software engineering; Systems engineering and theory; Dependability; Metamodel; Model-Driven Engineering; Pattern; Repository; Resource Constrained Embedded Systems; Security;
Conference_Titel :
Information Reuse and Integration (IRI), 2013 IEEE 14th International Conference on
Conference_Location :
San Francisco, CA
DOI :
10.1109/IRI.2013.6642505