A 500 MHz, 68% efficient, fully on-die digitally controlled buck Voltage Regulator on 22nm Tri-Gate CMOS

Author

Krishnamurthy, Harish K. ; Vaidya, Vaibhav A. ; Kumar, Pranaw ; Matthew, George E. ; Weng, Shijie ; Thiruvengadam, Bharani ; Proefrock, Wayne ; Ravichandran, Krishnan ; De, Vivek

Author_Institution

Intel Corp., Hillsboro, OR, USA

fYear

2014

fDate

10-13 June 2014

Firstpage

1

Lastpage

2

Abstract

A fully on-die, digitally controlled, 500MHz switching, 250mA rated output buck Voltage Regulator (VR) implemented in 22nm Tri-Gate CMOS is presented. The silicon measured a peak efficiency of 68% and consumed an area of 0.6mm² (without output decoupling) with a power density of about 410 mW/mm². The paper also demonstrates a controller bandwidth of 43MHz; the highest reported to date for any digital controller, resulting in output voltage ramp rates as high as 10V/μsec.

Keywords

CMOS integrated circuits; UHF integrated circuits; voltage regulators; bandwidth 43 MHz; current 250 mA; efficiency 68 percent; frequency 500 MHz; fully on-die digitally controlled buck voltage regulator; power density; size 22 nm; trigate CMOS; Bandwidth; Control systems; Delays; Frequency control; Inductors; Pulse width modulation; Voltage control;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Circuits Digest of Technical Papers, 2014 Symposium on

Conference_Location

Honolulu, HI

Print_ISBN

978-1-4799-3327-3

Type

conf

DOI

10.1109/VLSIC.2014.6858438

Filename

6858438