Title :
A 500 MHz, 68% efficient, fully on-die digitally controlled buck Voltage Regulator on 22nm Tri-Gate CMOS
Author :
Krishnamurthy, Harish K. ; Vaidya, Vaibhav A. ; Kumar, Pranaw ; Matthew, George E. ; Weng, Shijie ; Thiruvengadam, Bharani ; Proefrock, Wayne ; Ravichandran, Krishnan ; De, Vivek
Author_Institution :
Intel Corp., Hillsboro, OR, USA
Abstract :
A fully on-die, digitally controlled, 500MHz switching, 250mA rated output buck Voltage Regulator (VR) implemented in 22nm Tri-Gate CMOS is presented. The silicon measured a peak efficiency of 68% and consumed an area of 0.6mm2 (without output decoupling) with a power density of about 410 mW/mm2. The paper also demonstrates a controller bandwidth of 43MHz; the highest reported to date for any digital controller, resulting in output voltage ramp rates as high as 10V/μsec.
Keywords :
CMOS integrated circuits; UHF integrated circuits; voltage regulators; bandwidth 43 MHz; current 250 mA; efficiency 68 percent; frequency 500 MHz; fully on-die digitally controlled buck voltage regulator; power density; size 22 nm; trigate CMOS; Bandwidth; Control systems; Delays; Frequency control; Inductors; Pulse width modulation; Voltage control;
Conference_Titel :
VLSI Circuits Digest of Technical Papers, 2014 Symposium on
Conference_Location :
Honolulu, HI
Print_ISBN :
978-1-4799-3327-3
DOI :
10.1109/VLSIC.2014.6858438
