DocumentCode :
1832105
Title :
Study of the fluxing agent effects on the properties of no-flow underfill materials for flip-chip applications
Author :
Shi, S.H. ; Wong, C.P.
Author_Institution :
Sch. of Mater. Sci. & Eng., Georgia Inst. of Technol., Atlanta, GA, USA
fYear :
1998
fDate :
25-28 May 1998
Firstpage :
117
Lastpage :
124
Abstract :
As one of the key requirements of the no-flow underfilling process for flip-chip applications, a proper self-fluxing agent must be incorporated in the developed no-flow underfill materials to provide proper fluxing activity during the simultaneous solder reflow and underfill material curing. However, most fluxing agents have some adverse effects on the no-flow underfill material properties and assembly reliability. In this paper, we have extensively investigated the effect of the concentration of the selected fluxing agent on the material properties, interconnect integrity and assembly reliability. Through this work, an optimum concentration window of the fluxing agent is obtained and a routine procedure of evaluating fluxing agents is established
Keywords :
encapsulation; flip-chip devices; integrated circuit interconnections; integrated circuit reliability; microassembling; reflow soldering; assembly reliability; flip-chip applications; fluxing activity; fluxing agent effects; interconnect integrity; no-flow underfill materials; optimum concentration window; self-fluxing agent; solder reflow; underfill material curing; Assembly; Chemicals; Corrosion; Curing; Epoxy resins; Material properties; Materials reliability; Materials science and technology; Moisture; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components & Technology Conference, 1998. 48th IEEE
Conference_Location :
Seattle, WA
ISSN :
0569-5503
Print_ISBN :
0-7803-4526-6
Type :
conf
DOI :
10.1109/ECTC.1998.678680
Filename :
678680
Link To Document :
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