DocumentCode
183215
Title
A 0.63ps, 12b, synchronous cyclic TDC using a time adder for on-chip jitter measurement of a SoC in 28nm CMOS technology
Author
Sung-Jin Kim ; Taeik Kim ; Hojin Park
Author_Institution
Samsung Electron., Yongin, South Korea
fYear
2014
fDate
10-13 June 2014
Firstpage
1
Lastpage
2
Abstract
The first synchronous cyclic TDC is proposed in 28nm CMOS process. A novel 2x time amplifier whose gain is insensitive to variations and noise is proposed by using time conservative nature of the proposed synchronous time adder. The implemented 12b TDC occupies 0.01 mm2, consumes 820μW and it achieves 0.63ps of resolution over 2.6ns of input range.
Keywords
CMOS integrated circuits; adders; amplifiers; integrated circuit noise; jitter; system-on-chip; time-digital conversion; 2x time amplifier; CMOS technology; SoC; first synchronous cyclic TDC; on-chip jitter measurement; power 820 muW; size 28 nm; storage capacity 12 bit; synchronous time adder; time 0.63 ps; Adders; Calibration; Clocks; Delays; Jitter; System-on-chip;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Circuits Digest of Technical Papers, 2014 Symposium on
Conference_Location
Honolulu, HI
Print_ISBN
978-1-4799-3327-3
Type
conf
DOI
10.1109/VLSIC.2014.6858447
Filename
6858447
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