Title :
Multilevel global placement with retiming
Author :
Cong, Jason ; Yuan, Xin
Author_Institution :
Dept. of Comput. Sci., Univ. of California, Los Angeles, CA, USA
Abstract :
Multiple clock cycles are needed to cross the global interconnects for multi-gigahertz designs in nanometer technologies. For synchronous designs, this requires retiming and pipelining of global interconnects. In this paper, we present a practical solution for simultaneous retiming and multilevel global placement for performance optimization, based on the theory and algorithms for sequential timing analysis (Seq-TA). We extend the Seq-TA to handle gates/clusters with multiple outputs and integrate it into a multilevel optimization framework for simultaneous retiming and placement. We also develop two speed-up techniques which enable the Seq-TA to be efficiently integrated into a simulated annealing-based multilevel coarse placement for large-scale designs. Experimental results show that 1. retiming can improve the performance (delay) by 14% on average when it is applied after placement; 2. our approach for simultaneous retiming and placement can outperform the two-step approach (placement followed by retiming) by 10% on average in terms of delay minimization.
Keywords :
circuit optimisation; delays; flip-flops; integrated circuit interconnections; integrated logic circuits; logic gates; sequential circuits; simulated annealing; timing; annealing-based placement; deep sub-micron; delay minimization; global interconnects; large-scale designs; multigigahertz design; multilevel global placement; multilevel optimization; multiple clock cycles; multiple output gate clusters; nanometer technologies; performance optimization; physical hierarchy; sequential timing analysis; simulated annealing-based multilevel coarse placement; simultaneous retiming; synchronous designs; Algorithm design and analysis; Clocks; Clustering algorithms; Delay; Large scale integration; Optimization; Performance analysis; Pipeline processing; Simulated annealing; Timing;
Conference_Titel :
Design Automation Conference, 2003. Proceedings
Print_ISBN :
1-58113-688-9
DOI :
10.1109/DAC.2003.1218962