DocumentCode :
1832285
Title :
A flexible EMI measurement sheet to measure electric and magnetic fields separately with distributed antennas and LSI´s
Author :
Masunaga, Naoki ; Ishida, Koichi ; Zhou, Zhiwei ; Yasufuku, Tadashi ; Sekitani, Tsuyoshi ; Someya, Takao ; Takamiya, Makoto ; Sakurai, Takayasu
Author_Institution :
Inst. of Ind. Sci., Univ. of Tokyo, Tokyo, Japan
fYear :
2009
fDate :
17-21 Aug. 2009
Firstpage :
156
Lastpage :
160
Abstract :
A flexible 12 cm times 12 cm EMI measurement sheet is developed to enable the measurement of the EMI distribution on the surface of the electronic devices by wrapping the devices in the sheet. The sheet includes 8times8 antenna array, 2V organic CMOS decoder, stretchable interconnects, and EMI detection LSI´s (large scale integrations) in 0.18 mum CMOS. The distributed LSI´s near the antennas enable the in-situ EMI measurement and have a potential to improve the measurement speed and accuracy. By changing the connection of the antenna to the LSI, the electric and magnetic fields are successfully measured separately. The minimum detectable magnetic field noise power was -70 dBm and the maximum detectable noise frequency was 1GHz. The minimum detectable electric field noise power was -60 dBm and the maximum detectable noise frequency was 700 MHz.
Keywords :
CMOS integrated circuits; antenna arrays; electric field measurement; electromagnetic interference; integrated circuit interconnections; large scale integration; magnetic field measurement; EMI detection LSI; antenna array; distributed antennas; electric field measurement; electronic device; flexible EMI measurement sheet; frequency 1 GHz; frequency 700 MHz; large scale integration; magnetic field measurement; organic CMOS decoder; size 0.18 mum; stretchable interconnects; Antenna arrays; Antenna measurements; Electric variables measurement; Electromagnetic interference; Frequency; Large scale integration; Magnetic field measurement; Magnetic noise; Velocity measurement; Wrapping;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 2009. EMC 2009. IEEE International Symposium on
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-4266-9
Electronic_ISBN :
978-1-4244-4058-0
Type :
conf
DOI :
10.1109/ISEMC.2009.5284571
Filename :
5284571
Link To Document :
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